TY  - BOOK
AU  - Sachdev, Manoj
AU  - Gyvez, Jose Pineda de
TI  - Defect-oriented testing for nano-metric CMOS VLSI circuits
T2  - Frontiers electronic testing
SN  - 9788184894295
PB  - New Delhi
KW  - CMOS Technology
KW  - Digital CMOS Fault modeling
KW  - Nano-metric CMOS VLSI circuits  Defect-oriented testing
N1  - Reprint year 2010. Includes index
ER  -