Egerton, Ray F <br/><br/>
Physical principles of electron microscopy  an introduction to TEM, SEM and AEM 

 -  New York  Springer  2005 
 - xii, 202p. : ill.   
<br/><br/> Includes bibliographical references and index. 
<br/><br/><label>ISBN: </label>9780387258000 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Analytical electron microscopy(AEM)<br/>Electron microscopy  Physical principles<br/>Electron optics<br/>Scanning electron microscope(SEM)<br/>Transmission electron microscopeTEM