TY  - BOOK
AU  - Pavlov, Andrei
AU  - Manoj Sachdev
TI  - CMOS SRAM circuit design and parametric test in nano-scaled technologies : process - aware SRAM design and test  
T2  - Frontiers in electronic testing
SN  - 9788132202325
PB  - New Delhi
KW  - CMOS SRAM Circuit design
KW  - Complementary metal oxide semiconductors(CMOS)
KW  - Nanoscaled technologies
KW  - SRAM design
KW  - Static random access memories(SRAM)
N1  - Includes bibliographical references and index
ER  -