Bushnell, Michael L <br/><br/>
Essentials of electronics testing for digital, memory and mixed signal VLSI circuits 

 - New York  Springer  2000 
 - xviii, 690p.   
<br/><br/> Includes bibliographical references and index. 
<br/><br/><label>ISBN: </label>9780792379911 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Digital DFT and Scan design<br/>Digital integrated circuits -- Testing<br/>Electronic testing -- Digital integrated circuits<br/>Logic and Fault simulation<br/>Memory testing<br/>VLSI Integrated circuits -- Testing