TY  - BOOK
AU  - Sun, Yichuang ,ed.
TI  - Test and dianosis of analogue,mixed-signal and RF integrated circuits : the system on chip approach
T2  - Circuits, devices and systems; no.19
SN  - 9780863417450
CY  - London
KW  - Analogue,mixed-signal and
KW  - Fault diagnosis -- Linear/non-linear analogue circuits
KW  - RF integrated circuits -- Test and dianosis
N1  - Includes bibliographical references and index
ER  -