TY  - BOOK
AU  - Wang, Laung-Terng [ed]
TI  - VLSI test principles and architectures : design for testability
SN  - 9780123705976
CY  - San Francisco, CA
KW  - Integrated circuits -- Testing
KW  - Integrated circuits -- Very large scale integration -- Design
KW  - Integrated circuits -- Very large scale integration -- Testing
KW  - Logic design -- Data processing
KW  - Mixed signal circuits -- Testing
N1  - includes index
ER  -