TY  - BOOK
AU  - Wang, Laung - Terng [ed]
TI  - System-on-chip test architectures : nanometer design for testability
SN  - 9780123739735
CY  - USA
KW  - Architecture design -- Network-on-chip
KW  - Integrated circuit(IC) chips
KW  - Integrated circuits -- Design
KW  - Low-power techniques -- Network-on-chip
KW  - System-on-chip integration
KW  - Systems on a chip -- Testing
N1  - Includes index
ER  -