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1.		Built-in test for VLSI pseudorandom techniques by Bardell, Paul H McAnney, William H Savir, Jacob Material type: Text Publication details: New York ; John Wiley ; 1987 Availability: Items available for reference: AMRITA SCHOOL OF ENGINEERING: Not for loan (1)Location, call number: RF53-R1 621.38.049.2 M72. Save to lists Add to cart (remove)
2.		Essentials of electronic testing for digital memory and mixed - signal VLSI circuits by Bushnell, Michael L Agrawal, Vishwani D Material type: Text Publication details: New York ; Springer ; 2000 Availability: Items available for loan: AMRITA SCHOOL OF ENGINEERING (1)Location, call number: C8-R1 621.38.049 VLSI/P01;1. Place hold Save to lists Add to cart (remove)
3.	Image from Amazon.com	VLSI design by Debaprasad Das Material type: Text Publication details: New Delhi ; Oxford University Press ; 2010 Availability: Items available for reference: AMRITA SCHOOL OF ENGINEERING: Not for loan (1)Location, call number: C8-R3 621.38.049.2Q01. Save to lists Add to cart (remove)
4.	Image from Amazon.com	Power-aware testing and test strategies for low power devices by Girard, Patrick, ed Nicolici, Nicola, ed Wen, Xiaoqing, ed Material type: Text Publication details: New York ; Springer ; 2010 Availability: Items available for reference: AMRITA SCHOOL OF ENGINEERING: Not for loan (1)Location, call number: RF54-R2 621.382.77.9 Q0. Save to lists Add to cart (remove)

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