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Proceedings : 13th IEEE VLSI test symposium, April 30 - May 3, 1995, Princeton, New Jersey

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Material type: Text

TextPublication details: California; IEEE Computer scoiety press; 1995Description: xix, 493pISBN:

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Holdings
Item type	Home library	Collection	Call number	Status	Barcode
BOOKS	AMRITA SCHOOL OF ENGINEERING	REFERENCE	621.38.049.2 N52 (Browse shelf(Opens below))	Not for loan	11314

Sponsored by IEEE computer society technical committee on test technology, IEEE Philadelphia section

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