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1.	Image from Amazon.com	Microelectronics Failure Analysis: Desk Reference by Gandhi, Tejinder-ASM International-Electronic Device Failure Analysis Society Edition: Seventh edition Material type: Computer file; Format: electronic Language: English Publication details: ASM International ; 2019 Online resources: Click here to access online Availability: Items available for reference: EBOOKS-EBSCO ACADEMIC COLLECTION: Not for loan (1). Save to lists Add to cart (remove)
2.	Image from Amazon.com	ISTFA 2017 Conference Proceedings From the 43rd International Symposium for Testing and Failure Analysis: November 5-9, 2017, Pasadena Convention Center, Pasadena, California, USA by ASM International.-Electronic Device Failure Analysis Society Material type: Computer file; Format: electronic Language: English Publication details: ASM ; 2017 Online resources: Click here to access online Availability: Items available for reference: EBOOKS-EBSCO ACADEMIC COLLECTION: Not for loan (1). Save to lists Add to cart (remove)
3.	Image from Amazon.com	ISTFA 2003 Proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California by ASM International.-Electronic Device Failure Analysis Society Material type: Computer file; Format: electronic Language: English Publication details: ASM International ; 2003 Online resources: Click here to access online Availability: Items available for reference: EBOOKS-EBSCO ACADEMIC COLLECTION: Not for loan (1). Save to lists Add to cart (remove)
4.	Image from Amazon.com	ISTFA 2006 Proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA by ASM International.-Electronic Device Failure Analysis Society Material type: Computer file; Format: electronic Language: English Publication details: ASM International ; 2006 Online resources: Click here to access online Availability: Items available for reference: EBOOKS-EBSCO ACADEMIC COLLECTION: Not for loan (1). Save to lists Add to cart (remove)
5.	Image from Amazon.com	ISTFA 2010 Conference Proceedings From the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA by ASM International.-Electronic Device Failure Analysis Society Material type: Computer file; Format: electronic Language: English Publication details: ASM International ; 2010 Online resources: Click here to access online Availability: Items available for reference: EBOOKS-EBSCO ACADEMIC COLLECTION: Not for loan (1). Save to lists Add to cart (remove)