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Physical principles of electron microscopy an introduction to TEM, SEM and AEM

By: Material type: TextTextPublication details: New York; Springer; 2005Description: xii, 202p. : illISBN:
  • 9780387258000
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Item type Home library Collection Call number Status Barcode
BOOKS BOOKS AMRITA SCHOOL OF ENGINEERING REFERENCE 537.533.35 P50 (Browse shelf(Opens below)) Not for loan 47151

Includes bibliographical references and index.

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