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Spectroscopic Ellipsometry Practical Application to Thin Film Characterization

By: Material type: Computer fileComputer fileLanguage: English Series: Materials Characterization and Analysis CollectionPublication details: Momentum Press; 2016ISBN:
  • 9781606507278
Subject(s): Online resources:
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Item type Home library Status Barcode
E-BOOKS E-BOOKS EBOOKS-EBSCO ACADEMIC COLLECTION Not for loan EBB87811

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