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1.	Image from Amazon.com	A designer's guide to built-in-self-test by Stroud, Charles E Series: Frontiers in electronic testing series Material type: Text Publication details: London ; Kluwer Academic ; 2002 Availability: Items available for reference: AMRITA SCHOOL OF ENGINEERING: Not for loan (1)Location, call number: RF52-R3 621.38.032 P2. Save to lists Add to cart (remove)
2.		Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits by Bushnell, Michael L Agrawal, Vishwani D Series: Frontiers in electronic testing Material type: Text Publication details: New York ; Springer ; 2000 Availability: Items available for loan: AMRITA SCHOOL OF ENGINEERING (1)Location, call number: C9-R1 621.38.049.3 P00;3. Place hold Save to lists Add to cart (remove)
4.	Image from Amazon.com	CMOS SRAM circuit design and parametric test in nano-scaled technologies : process - aware SRAM design and test by Pavlov, Andrei Manoj Sachdev Series: Frontiers in electronic testing Material type: Text Publication details: New Delhi ; Springer ; 2008 Availability: Items available for reference: AMRITA SCHOOL OF ENGINEERING: Not for loan (1)Location, call number: C7-R1 621.38.049CMOSP80. Save to lists Add to cart (remove)
5.	Image from Amazon.com	Timing Performance of Nanometer Digital Circuits Under Process Variations by Victor Champac Series: Frontiers in Electronic Testing Edition: 2018 Material type: Computer file; Format: electronic Publication details: Springer ; 2018 Online resources: Click here to access online Availability: Items available for reference: EBOOKS: Not for loan (1). Save to lists Add to cart (remove)