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1.	Image from Amazon.com	X-Ray Fluorescence Spectrometry and Its Applications to Archaeology An Illustrated Guide by Mary Kate Donais-David B. George Series: Materials Characterization and Analysis Collection Material type: Computer file; Format: electronic Language: English Publication details: Momentum Press ; 2018 Online resources: Click here to access online Availability: Items available for reference: EBOOKS-EBSCO ACADEMIC COLLECTION: Not for loan (1). Save to lists Add to cart (remove)
2.	Image from Amazon.com	Spectroscopic Ellipsometry Practical Application to Thin Film Characterization by Harland G. Tompkins-James N. Hilfiker Series: Materials Characterization and Analysis Collection Material type: Computer file; Format: electronic Language: English Publication details: Momentum Press ; 2016 Online resources: Click here to access online Availability: Items available for reference: EBOOKS-EBSCO ACADEMIC COLLECTION: Not for loan (1). Save to lists Add to cart (remove)
3.	Image from Amazon.com	Secondary Ion Mass Spectrometry Applications for Depth Profiling and Surface Characterization by Stevie, F. A Series: Materials Characterization and Analysis Collection Material type: Computer file; Format: electronic Language: English Publication details: Momentum Press ; 2016 Online resources: Click here to access online Availability: Items available for reference: EBOOKS-EBSCO ACADEMIC COLLECTION: Not for loan (1). Save to lists Add to cart (remove)
4.	Image from Amazon.com	A Practical Guide to Transmission Electron Microscopy Fundamentals by Luo, Zhiping Series: Materials Characterization and Analysis Collection Edition: First edition Material type: Computer file; Format: electronic Language: English Publication details: Momentum Press ; 2016 Online resources: Click here to access online Availability: Items available for reference: EBOOKS-EBSCO ACADEMIC COLLECTION: Not for loan (1). Save to lists Add to cart (remove)
5.	Image from Amazon.com	Auger Electron Spectroscopy Practical Application to Materials Analysis and Characterization of Surfaces, Interfaces, and Thin Films by Wolstenholme, John Series: Materials Characterization and Analysis Collection Material type: Computer file; Format: electronic Language: English Publication details: Momentum Press ; 2015 Online resources: Click here to access online Availability: Items available for reference: EBOOKS-EBSCO ACADEMIC COLLECTION: Not for loan (1). Save to lists Add to cart (remove)