Your search returned 2 results.

Not what you expected? Check for suggestions

Results
	1.	Image from Amazon.com	Frontiers of VLSI design and test : proceedings of VLSI design and test workshops by VLSI design and test workshops (2001 : New Delhi) Material type: Text Publication details: New Delhi ; Phoenix publishing ; 2001 Availability: Items available for reference: AMRITA SCHOOL OF ENGINEERING: Not for loan (1)Location, call number: RF22-R1 621.38.049.2 P10. Save to lists Add to cart (remove)
	2.	Image from Amazon.com	System-on-chip test architectures : nanometer design for testability by Wang, Laung - Terng [ed] Material type: Text Publication details: USA ; Morgan Kaufmann ; 2008 Availability: Items available for reference: AMRITA SCHOOL OF ENGINEERING: Not for loan (2)Location, call number: RF54-R2 621.382.77.5 P80, ... Save to lists Add to cart (remove)

Central Library - Coimbatore