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1.		Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits by Bushnell, Michael L Agrawal, Vishwani D Material type: Text Publication details: Boston ; Kluwer Academic ; 2000 Availability: Items available for reference: AMRITA SCHOOL OF ENGINEERING: Not for loan (1)Location, call number: RF53-R2 621.38.049.3 P00;1. Save to lists Add to cart (remove)
2.		Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits by Bushnell, Michael L Agrawal, Vishwani D Series: Frontiers in electronic testing Material type: Text Publication details: New York ; Springer ; 2000 Availability: Not available: AMRITA SCHOOL OF ENGINEERING: Checked out (2). Place hold Save to lists Add to cart (remove)
3.	Image from Amazon.com	Essentials of electronics testing for digital, memory and mixed signal VLSI circuits by Bushnell, Michael L Vishwani D Agrawal Material type: Text Publication details: New York ; Springer ; 2000 Availability: Not available: AMRITA SCHOOL OF ENGINEERING: Checked out (5). Place hold Save to lists Add to cart (remove)
4.	Image from Amazon.com	Testing of Digital Systems by N. K. Jha-S. Gupta Material type: Computer file; Format: electronic Language: English Publication details: Cambridge University Press ; 2003 Online resources: Click here to access online Availability: Items available for reference: EBOOKS-EBSCO ACADEMIC COLLECTION: Not for loan (1). Save to lists Add to cart (remove)