Your search returned 2 results.

Not what you expected? Check for suggestions

Results
	1.		An introduction to mixed-signal IC test and measurement by Burns, Mark Roberts, Gordon W Series: Oxford series in electrical and computer engineering Material type: Text Publication details: New York ; Oxford University Press ; 2001 Availability: Items available for loan: AMRITA SCHOOL OF ENGINEERING (1)Location, call number: C6-R2 621.38.049 P13. Place hold Save to lists Add to cart (remove)
	2.	Image from Amazon.com	VLSI test principles and architectures : design for testability by Wang, Laung-Terng [ed] Material type: Text Publication details: San Francisco, CA ; Morgan Kauffman ; 2006 Availability: Items available for reference: AMRITA SCHOOL OF ENGINEERING: Not for loan (2)Location, call number: RF53-R2 621.38.049.2 P60, ... Save to lists Add to cart (remove)

Central Library - Coimbatore