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	1.		Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits by Bushnell, Michael L Agrawal, Vishwani D Material type: Text Publication details: Boston ; Kluwer Academic ; 2000 Availability: Items available for reference: AMRITA SCHOOL OF ENGINEERING: Not for loan (1)Location, call number: RF53-R2 621.38.049.3 P00;1. Save to lists Add to cart (remove)
	2.		Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits by Bushnell, Michael L Agrawal, Vishwani D Series: Frontiers in electronic testing Material type: Text Publication details: New York ; Springer ; 2000 Availability: Items available for loan: AMRITA SCHOOL OF ENGINEERING (1)Location, call number: C9-R1 621.38.049.3 P00;3. Place hold Save to lists Add to cart (remove)

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