000 00608nmm a2200217Ia 4500
001 EBK1348
005 20250328114556.0
008 250328s9999 xx 000 0 und d
020 _a9783319093093
100 _aMehdi Dehbashi
245 0 _aDebug Automation from Pre-silicon to Post-silicon
250 _a2015
260 _bspringer
260 _c2015
650 _aElectronic Circuits and systems
650 _aEngineering
700 _a GOrschwin Fey
856 _3Click here to access online
856 _uhttps://link.springer.com/openurl?genre=book&isbn=978-3-319-09309-3
942 _cEBK
999 _c143353
_d143353