| 000 | 00669nmm a2200229Ia 4500 | ||
|---|---|---|---|
| 001 | EBK2678 | ||
| 005 | 20250328114628.0 | ||
| 008 | 250328s9999 xx 000 0 und d | ||
| 020 | _a9789814451215 | ||
| 100 | _aCher Ming Tan | ||
| 245 | 0 | _aElectromigration Modeling at Circuit Layout Level | |
| 250 | _a2013 | ||
| 260 | _bspringer | ||
| 260 | _c2013 | ||
| 490 | _aspringerBriefs in Applied sciences and Technology | ||
| 650 | _aEngineering | ||
| 650 | _asecurity science and Technology | ||
| 700 | _a Feifei He | ||
| 856 | _3Click here to access online | ||
| 856 | _uhttps://link.springer.com/openurl?genre=book&isbn=978-981-4451-21-5 | ||
| 942 | _cEBK | ||
| 999 |
_c144683 _d144683 |
||