| 000 | 00711nmm a2200241Ia 4500 | ||
|---|---|---|---|
| 001 | EBK3031 | ||
| 005 | 20250328121305.0 | ||
| 008 | 250328s9999 xx 000 0 und d | ||
| 020 | _a9789400776630 | ||
| 100 | _aJacopo Franco | ||
| 245 | 0 | _aReliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications | |
| 250 | _a2014 | ||
| 260 | _bSpringer | ||
| 260 | _c2014 | ||
| 490 | _aSpringer Series in Advanced Microelectronics | ||
| 650 | _aEngineering | ||
| 650 | _aSemiconductors | ||
| 700 | _a Tien Wen Sung | ||
| 700 | _a Vaclav Snasel | ||
| 856 | _3Click here to access online | ||
| 856 | _uhttps://link.springer.com/openurl?genre=book&isbn=978-94-007-7663-0 | ||
| 942 | _cEBK | ||
| 999 |
_c145036 _d145036 |
||