| 000 | 00586nmm a2200217Ia 4500 | ||
|---|---|---|---|
| 001 | EBK3035 | ||
| 005 | 20250328121305.0 | ||
| 008 | 250328s9999 xx 000 0 und d | ||
| 020 | _a9781493913497 | ||
| 100 | _aManjul Bhushan | ||
| 245 | 0 | _aCMOS Test and Evaluation | |
| 250 | _a2015 | ||
| 260 | _bSpringer | ||
| 260 | _c2015 | ||
| 650 | _a Instrumentation | ||
| 650 | _aElectronics and Microelectronics | ||
| 650 | _aEngineering | ||
| 856 | _3Click here to access online | ||
| 856 | _uhttps://link.springer.com/openurl?genre=book&isbn=978-1-4939-1349-7 | ||
| 942 | _cEBK | ||
| 999 |
_c145040 _d145040 |
||