| 000 | 00649nmm a2200217Ia 4500 | ||
|---|---|---|---|
| 001 | EBK5769 | ||
| 005 | 20250328121404.0 | ||
| 008 | 250328s9999 xx 000 0 und d | ||
| 020 | _a9783319754659 | ||
| 100 | _aVictor Champac | ||
| 245 | 0 | _aTiming Performance of Nanometer Digital Circuits Under Process Variations | |
| 250 | _a2018 | ||
| 260 | _bSpringer | ||
| 260 | _c2018 | ||
| 490 | _aFrontiers in Electronic Testing | ||
| 650 | _aElectronic Circuits and Systems | ||
| 650 | _aEngineering | ||
| 856 | _3Click here to access online | ||
| 856 | _uhttps://link.springer.com/openurl?genre=book&isbn=978-3-319-75465-9 | ||
| 942 | _cEBK | ||
| 999 |
_c147774 _d147774 |
||