| 000 | 00588nmm a2200205Ia 4500 | ||
|---|---|---|---|
| 001 | EBK6022 | ||
| 005 | 20250328123625.0 | ||
| 008 | 250328s9999 xx 000 0 und d | ||
| 020 | _a9783319912042 | ||
| 100 | _aIreneusz Mrozek | ||
| 245 | 0 | _aMulti run Memory Tests for Pattern Sensitive Faults | |
| 250 | _a1st ed 2019 | ||
| 260 | _bspringer | ||
| 260 | _c2019 | ||
| 650 | _aElectronic Circuits and Systems | ||
| 650 | _aEngineering | ||
| 856 | _3Click here to access online | ||
| 856 | _uhttps://link.springer.com/openurl?genre=book&isbn=978-3-319-91204-2 | ||
| 942 | _cEBK | ||
| 999 |
_c148027 _d148027 |
||