000 00674nmm a2200229Ia 4500
001 EBK8349
005 20250328123719.0
008 250328s9999 xx 000 0 und d
020 _a9783030683689
100 _aAlexandra Zimpeck
245 0 _aMitigating Process Variability and Soft Errors at Circuit Level for FinFETs
250 _a2021
260 _bspringer
260 _c2021
650 _aElectronic Circuits and Systems
650 _aEngineering
700 _a Cristina Meinhardt
700 _a Laurent Artola
856 _3Click here to access online
856 _uhttps://link.springer.com/openurl?genre=book&isbn=978-3-030-68368-9
942 _cEBK
999 _c150354
_d150354