000 00670nmm a2200229Ia 4500
001 EBK22155
005 20250328155433.0
008 250328s9999 xx 000 0 und d
020 _a9789811985515
100 _aXiaowei Li
245 0 _aBuilt-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design
250 _a2023
260 _bSpringer
260 _c2023
650 _aComputer Science
650 _aHardware Performance and Reliability
700 _a Cheng Liu
700 _a Guihai Yan
856 _3Click here to access online
856 _uhttps://link.springer.com/openurl?genre=book&isbn=978-981-19-8551-5
942 _cEBK
999 _c170160
_d170160