000			00622nam a2200217Ia 4500
001			3742
005			20250221144609.0
008			250214s9999||||xx |||||||||||||| ||und||
020			_a0-07-113461-1
100			_aLenk, John D
245		0	_aMcGraw-Hill electronic testing handbook : procedures and techniques
260			_aNew York
260			_bMcGraw-Hill
260			_c1994
300			_axvii, 397p: ill.
490			_aMcGraw-Hill electrical engineering series
500			_aIncludes index
650			_aElectronic instruments -- Handbook
650			_aElectronics and communication engineering
942			_cBK
999			_c19896 _d19896