000			00547nam a2200205Ia 4500
001			6647
005			20250221145819.0
008			250214s9999||||xx |||||||||||||| ||und||
020			_a750694726
100			_aAfshar, Amir
245		0	_aPrinciples of semiconductor network testing
260			_aBoston
260			_bButterworth-Heinemann
260			_c1995
300			_a213p. ;
500			_aIncludes bibliographical references and index.
650			_aIntegrated circuits -- Tedting
650			_aSemiconductors -- Testing
942			_cBK
999			_c22769 _d22769