| 000 | 00911nmm a2200241Ia 4500 | ||
|---|---|---|---|
| 001 | EBB171172 | ||
| 005 | 20250820140747.0 | ||
| 008 | 250820s9999||||xx |||||||||||||||||und|| | ||
| 020 | _a9781615030088 | ||
| 041 | _aeng | ||
| 100 | _aINTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSIS (35TH: 2009: SAN JOSE, CALIF.) | ||
| 245 | 0 | _aIstfa 2009 | |
| 245 | 0 | _bCONFERENCE PROCEEDINGS FROM THE 35TH INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSIS | |
| 260 | _bASM International | ||
| 260 | _c2009 | ||
| 490 | _aISTFA. PROCEEDINGS | ||
| 650 | _a Mechanical | ||
| 650 | _aElectronic apparatus and appliances--Testing--Congresses.,Electronics--Materials--Testing--Congresses. | ||
| 650 | _aTECHNOLOGY & ENGINEERING | ||
| 856 | _3Click here to access online | ||
| 856 | _uhttps://search.ebscohost.com/login.aspx?direct=true&db=e000xww&site=ehost-live&scope=site&AN=395916 | ||
| 942 | _cEBK | ||
| 999 |
_c372679 _d372679 |
||