| 000 | 00944nmm a2200241Ia 4500 | ||
|---|---|---|---|
| 001 | EBB171222 | ||
| 005 | 20250820140748.0 | ||
| 008 | 250820s9999||||xx |||||||||||||||||und|| | ||
| 020 | _a9780871707888 | ||
| 041 | _aeng | ||
| 100 | _aASM International.-Electronic Device Failure Analysis Society. | ||
| 245 | 0 | _aISTFA 2003 | |
| 245 | 0 | _bProceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California | |
| 260 | _bASM International | ||
| 260 | _c2003 | ||
| 650 | _a Digital | ||
| 650 |
_a Electronics _978 |
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| 650 | _aElectronic apparatus and appliances--Testing--Congresses.,Electronics--Materials--Testing--Congresses. | ||
| 650 | _aTECHNOLOGY & ENGINEERING | ||
| 856 | _3Click here to access online | ||
| 856 | _uhttps://search.ebscohost.com/login.aspx?direct=true&db=e000xww&site=ehost-live&scope=site&AN=395862 | ||
| 942 | _cEBK | ||
| 999 |
_c372729 _d372729 |
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