| 000 | 01099nmm a2200229Ia 4500 | ||
|---|---|---|---|
| 001 | EBB171235 | ||
| 005 | 20250820140748.0 | ||
| 008 | 250820s9999||||xx |||||||||||||||||und|| | ||
| 020 | _a9780871707451 | ||
| 041 | _aeng | ||
| 100 | _aThe Electronic Device Failure Analysis Society Desk Reference Committee | ||
| 245 | 0 | _aMicroelectronics Failure Analysis Desk Reference, 2001 Supplement | |
| 260 | _bASM International | ||
| 260 | _c2001 | ||
| 650 |
_a Electronics _978 |
||
| 650 | _a Microelectronics | ||
| 650 | _aElectronic apparatus and appliances--Testing--Handbooks, manuals, etc.,Electronics--Materials--Testing--Handbooks, manuals, etc.,Microelectronics--Defects--Handbooks, manuals, etc.,Microelectronics--Materials--Defects--Handbooks, manuals, etc.,Microelectronics--Materials--Testing--Handbooks, manuals, etc.,Semiconductors--Defects--Handbooks, manuals, etc. | ||
| 650 | _aTECHNOLOGY & ENGINEERING | ||
| 856 | _3Click here to access online | ||
| 856 | _uhttps://search.ebscohost.com/login.aspx?direct=true&db=e000xww&site=ehost-live&scope=site&AN=395849 | ||
| 942 | _cEBK | ||
| 999 |
_c372742 _d372742 |
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