000 00756nam a2200241Ia 4500
001 M3301
005 20250218201658.0
008 250218s9999 xx 000 0 und d
020 _a0132247674
100 _aAmbler A P (ed)
245 0 _aEconomics of design and test for electronic circuits and systems
250 _a1
260 _aNew York
260 _bEllis Horwood
260 _c1992
300 _a"vi, 301p. : ill. ; 24 cm."
500 _a"Papers presented at the First International Workshop on the Economics of Design and Test, held at MCC, Austin, Texas"
650 _aElectronic circuit design--Congresses
650 _aElectronic circuits--Testing--Congresses
700 _aAbadir M (ed)
700 _aSastry S (ed)
942 _cBK
999 _c3882
_d3882