| 000 | 00938nmm a2200253Ia 4500 | ||
|---|---|---|---|
| 001 | EBB210099 | ||
| 005 | 20250823114104.0 | ||
| 008 | 250823s9999||||xx |||||||||||||||||und|| | ||
| 020 | _a9780123739735 | ||
| 041 | _aeng | ||
| 100 | _aLaung-Terng Wang-Charles E. Stroud-Nur A. Touba | ||
| 245 | 0 | _aSystem-on-Chip Test Architectures | |
| 245 | 0 | _bNanometer Design for Testability | |
| 260 | _bMorgan Kaufmann | ||
| 260 | _c2008 | ||
| 490 | _aThe Morgan Kaufmann Series in Systems on Silicon | ||
| 650 | _a Industrial Design | ||
| 650 | _a Product | ||
| 650 | _aIntegrated circuits--Very large scale integration--Design.,Integrated circuits--Very large scale integration--Testing.,Systems on a chip--Testing. | ||
| 650 | _aTECHNOLOGY & ENGINEERING | ||
| 856 | _3Click here to access online | ||
| 856 | _uhttps://search.ebscohost.com/login.aspx?direct=true&db=e000xww&site=ehost-live&scope=site&AN=214796 | ||
| 942 | _cEBK | ||
| 999 |
_c411606 _d411606 |
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