| 000 | 00795nmm a2200217Ia 4500 | ||
|---|---|---|---|
| 001 | EBB217570 | ||
| 005 | 20250823115611.0 | ||
| 008 | 250823s9999||||xx |||||||||||||||||und|| | ||
| 020 | _a9781860945892 | ||
| 041 | _aeng | ||
| 100 | _aManuel Jesus Bellido Diaz-Jorge Juan Chico-Manuel Valencia | ||
| 245 | 0 | _aLogic-timing Simulation And The Degradation Delay Model | |
| 260 | _bImperial College Press | ||
| 260 | _c2006 | ||
| 650 | _a Electrical | ||
| 650 | _aIntegrated circuits--Very large scale integration.,Metal oxide semiconductors, Complementary.,Timing circuits. | ||
| 650 | _aTECHNOLOGY & ENGINEERING | ||
| 856 | _3Click here to access online | ||
| 856 | _uhttps://search.ebscohost.com/login.aspx?direct=true&db=e000xww&site=ehost-live&scope=site&AN=174630 | ||
| 942 | _cEBK | ||
| 999 |
_c419077 _d419077 |
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