| 000 | 00733nmm a2200241Ia 4500 | ||
|---|---|---|---|
| 001 | EBK5251 | ||
| 005 | 20260109104313.0 | ||
| 008 | 260109s9999||||xx |||||||||||||||||und|| | ||
| 020 | _a9789811065170 | ||
| 100 | _aRaveendranath U Nair | ||
| 245 | 0 | _aEM Material Characterization Techniques for Metamaterials | |
| 250 | _a1st ed. 2018 | ||
| 260 | _bSpringer | ||
| 260 | _c2018 | ||
| 490 | _aSpringerBriefs in Electrical and Computer Engineering | ||
| 650 | _aEngineering | ||
| 650 | _aMicrowaves | ||
| 650 | _aRF Engineering and Optical Communications | ||
| 700 | _aWonik Choi | ||
| 856 | _3Click here to access online | ||
| 856 | _uhttps://link.springer.com/openurl?genre=book&isbn=978-981-10-6517-0 | ||
| 942 | _cEBK | ||
| 999 |
_c463058 _d463058 |
||