000			00579nam a2200217Ia 4500
001			37829
005			20250221153955.0
008			250214s9999||||xx |||||||||||||| ||und||
020			_a471624632
100			_aBardell, Paul H
245		0	_aBuilt-in test for VLSI pseudorandom techniques
260			_aNew York
260			_bJohn Wiley
260			_c1987
300			_axiii, 354p. ;
500			_aIncludes index
650			_aIntegrated circuits -- Very large scale integration(VLSI) -- Testing
700			_aMcAnney, William H
700			_aSavir, Jacob
942			_cBK
999			_c53628 _d53628