000			00810nam a2200277Ia 4500
001			43693
005			20250221154701.0
008			250214s9999||||xx |||||||||||||| ||und||
020			_a8172248911
100			_aAbramovici, Miron, Ed.
245		0	_aDigital systems testing and testable design
260			_aChennai
260			_bJaico Publishing
260			_c2008
300			_axviii, 652p:
500			_aIncludes bibligraphical references and index
650			_aBridging faults Testing
650			_aDigital systems Testing
650			_aFault modeling and simulation
650			_aLogic-level diagnosis
650			_aSingle stuck faults Testing
650			_aTestable design -- Digital systems
700			_aBreuer, Melvin, A, Ed
700			_aFriedman, Arthur, D, Ed.
942			_cBK
999			_c59484 _d59484