000			00913nam a2200289Ia 4500
001			45960
005			20250221155018.0
008			250214s9999||||xx |||||||||||||| ||und||
020			_a792379918
100			_aBushnell, Michael L
245		0	_aEssentials of electronic testing for digital, memory and mixed-signal VLSI circuits
260			_bNew York
260			_bSpringer
260			_c2000
300			_axviii, 690p.
490			_aFrontiers in electronic testing
500			_aIncludes bibliographical references and index
650			_aDigital DFT and Scan design
650			_aDigital integrated circuits Testing
650			_aElectronic testing Digital integrated circuits
650			_aLogic and Fault simulation
650			_aMemory testing
650			_aTesting Electronic testing
650			_aVLSI Integrated circuits Testing
700			_aAgrawal, Vishwani D
942			_cBK
999			_c61750 _d61750