000 | 00734nam a2200265Ia 4500 | ||
---|---|---|---|
001 | 48894 | ||
005 | 20250221155345.0 | ||
008 | 250214s9999||||xx |||||||||||||| ||und|| | ||
020 | _a9788126523061 | ||
100 | _aMourad, Samiha | ||
245 | 0 | _aPrinciples of testing electronic systems | |
260 | _bNew Delhi | ||
260 | _bWiley India | ||
260 | _c2000 | ||
300 | _axix, 420p. | ||
500 | _aIncludes bibliographical references and index | ||
650 | _aAd hoc techniques | ||
650 | _aBoundary-scan testing | ||
650 | _aElectronic systems Testing | ||
650 | _aFPGAs and microprocessors Testing | ||
650 | _aTesting Electronic systems | ||
650 | _aVLSI Design flow | ||
700 | _aZorian, Yervant | ||
942 | _cBK | ||
999 |
_c64684 _d64684 |