000			00680nam a2200253Ia 4500
001			49510
005			20250221155359.0
008			250214s9999||||xx |||||||||||||| ||und||
020			_a9788184890297
100			_aGrout, Ian A
245		0	_aIntegrated circuit test engineering : modern techniques
260			_bNew Delhi
260			_bSpringer
260			_c2006
300			_axxx, 362p.
500			_aIncludes bibliographical references and index
650			_aAnalogue test
650			_aCMOS Technology
650			_aDigital logic test
650			_aIntegrated circuit test engineering
650			_aMemory test
650			_aMixed-signal test
942			_cBK
999			_c65300 _d65300