000 | 00830nam a2200265Ia 4500 | ||
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001 | 51751 | ||
005 | 20250221155448.0 | ||
008 | 250214s9999||||xx |||||||||||||| ||und|| | ||
020 | _a9788132202325 | ||
100 | _aPavlov, Andrei | ||
245 | 0 | _aCMOS SRAM circuit design and parametric test in nano-scaled technologies : process - aware SRAM design and test | |
260 | _bNew Delhi | ||
260 | _bSpringer | ||
260 | _c2008 | ||
300 | _axvi, 193p. | ||
490 | _aFrontiers in electronic testing | ||
500 | _aIncludes bibliographical references and index | ||
650 | _aCMOS SRAM Circuit design | ||
650 | _aComplementary metal oxide semiconductors(CMOS) | ||
650 | _aNanoscaled technologies | ||
650 | _aSRAM design | ||
650 | _aStatic random access memories(SRAM) | ||
700 | _aManoj Sachdev | ||
942 | _cBK | ||
999 |
_c67540 _d67540 |