000			00832nam a2200265Ia 4500
001			52680
005			20250221155837.0
008			250214s9999||||xx |||||||||||||| ||und||
020			_a9780792379911
100			_aBushnell, Michael L
245		0	_aEssentials of electronics testing for digital, memory and mixed signal VLSI circuits
260			_aNew York
260			_bSpringer
260			_c2000
300			_axviii, 690p.
500			_aIncludes bibliographical references and index.
650			_aDigital DFT and Scan design
650			_aDigital integrated circuits -- Testing
650			_aElectronic testing -- Digital integrated circuits
650			_aLogic and Fault simulation
650			_aMemory testing
650			_aVLSI Integrated circuits -- Testing
700			_aVishwani D Agrawal
942			_cBK
999			_c68468 _d68468