000			00775nam a2200229Ia 4500
001			58725
005			20250221160244.0
008			250214s9999||||xx |||||||||||||| ||und||
020			_a9780863417450
100			_aSun, Yichuang ,ed.
245		0	_aTest and dianosis of analogue,mixed-signal and RF integrated circuits : the system on chip approach
260			_aLondon
260			_bThe Institution of Engineering Technology
260			_c2008
300			_axxxvi, 806p.
490			_aCircuits, devices and systems; no.19
500			_aIncludes bibliographical references and index
650			_aAnalogue,mixed-signal and
650			_aFault diagnosis -- Linear/non-linear analogue circuits
650			_aRF integrated circuits -- Test and dianosis
942			_cBK
999			_c74495 _d74495