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ISTFA 2007 Proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA

By: Material type: Computer fileComputer fileLanguage: English Publication details: ASM International; 2007ISBN:
  • 9780871708632
Subject(s): Online resources:
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Item type Home library Status Barcode
E-BOOKS E-BOOKS EBOOKS-EBSCO ACADEMIC COLLECTION Not for loan EBB171180

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