ISTFA 2007 Proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA
Material type:
Computer fileLanguage: English Publication details: ASM International; 2007ISBN: - 9780871708632
| Item type | Home library | Status | Barcode | |
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E-BOOKS
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EBOOKS-EBSCO ACADEMIC COLLECTION | Not for loan | EBB171180 |
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