System-on-Chip Test Architectures Nanometer Design for Testability

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Computer fileLanguage: English Series: The Morgan Kaufmann Series in Systems on SiliconPublication details: Morgan Kaufmann; 2008ISBN:

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Item type	Home library	Status	Barcode
E-BOOKS	EBOOKS-EBSCO ACADEMIC COLLECTION	Not for loan	EBB210099

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Central Library - Coimbatore