Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits
Bushnell, Michael L
Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits - New York Springer 2000 - xviii, 690p. - Frontiers in electronic testing .
Includes bibliographical references and index
792379918
Digital DFT and Scan design
Digital integrated circuits Testing
Electronic testing Digital integrated circuits
Logic and Fault simulation
Memory testing
Testing Electronic testing
VLSI Integrated circuits Testing
Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits - New York Springer 2000 - xviii, 690p. - Frontiers in electronic testing .
Includes bibliographical references and index
792379918
Digital DFT and Scan design
Digital integrated circuits Testing
Electronic testing Digital integrated circuits
Logic and Fault simulation
Memory testing
Testing Electronic testing
VLSI Integrated circuits Testing