Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits (Record no. 61750)
[ view plain ]
| 000 -LEADER | |
|---|---|
| fixed length control field | 00913nam a2200289Ia 4500 |
| 001 - CONTROL NUMBER | |
| control field | 45960 |
| 005 - DATE AND TIME OF LATEST TRANSACTION | |
| control field | 20250221155018.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 250214s9999||||xx |||||||||||||| ||und|| |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 792379918 |
| 100 ## - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Bushnell, Michael L |
| 245 #0 - TITLE STATEMENT | |
| Title | Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. | |
| Name of publisher, distributor, etc. | New York |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. | |
| Name of publisher, distributor, etc. | Springer |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. | |
| Date of publication, distribution, etc. | 2000 |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | xviii, 690p. |
| 490 ## - SERIES STATEMENT | |
| Series statement | Frontiers in electronic testing |
| 500 ## - GENERAL NOTE | |
| General note | Includes bibliographical references and index |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Digital DFT and Scan design |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Digital integrated circuits Testing |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Electronic testing Digital integrated circuits |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Logic and Fault simulation |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Memory testing |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Testing Electronic testing |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | VLSI Integrated circuits Testing |
| 700 ## - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Agrawal, Vishwani D |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Koha item type | BOOKS |
| Date last seen | Total checkouts | Full call number | Barcode | Price effective from | Koha item type | Lost status | Damaged status | Not for loan | Withdrawn status | Home library | Current library | Shelving location | Date acquired | Cost, normal purchase price |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| 21.02.2025 | 621.38.049.3 P00;3 | 45960 | 21.02.2025 | BOOKS | AMRITA SCHOOL OF ENGINEERING | AMRITA SCHOOL OF ENGINEERING | C9-R1 | 21.02.2025 | 1195.00 |