ISTFA 2005 Proceedings of the 31st International Symposium for Testing and Failure Analysis, November 6-10, 2005, McEnery Convention Center, San Jose, California

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Computer fileLanguage: English Publication details: ASM International; 2005ISBN:

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Item type	Home library	Status	Barcode
E-BOOKS	EBOOKS-EBSCO ACADEMIC COLLECTION	Not for loan	EBB171203

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