Defect-oriented testing for nano-metric CMOS VLSI circuits

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Material type: Text

TextSeries: Frontiers electronic testingPublication details: New Delhi; Springer; 2007Edition: 2Description: xxi, 328pISBN:

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Item type	Home library	Call number	Status	Barcode
BOOKS	AMRITA SCHOOL OF ENGINEERING	621.38.049 CMOS/P71 (Browse shelf(Opens below))	Available	45970

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Previous	621.38.049 CMOS/P51 CMOS integrated analog-to-digital and digital-to-analog converters	621.38.049 CMOS/P54 Basics of CMOS cell design	621.38.049 CMOS/P7 Advanced cmos cell design	621.38.049 CMOS/P71 Defect-oriented testing for nano-metric CMOS VLSI circuits	621.38.049 P0 CMOS: circuit design, layout, and simulation	621.38.049 P10;Q7 Design of analog CMOS integrated circuits	621.38.049 P20 CMOS/BiCMOS ULSI : low voltage, low power	Next

Reprint year 2010. Includes index

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