System-on-chip test architectures : nanometer design for testability

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Material type: Text

TextPublication details: USA; Morgan Kaufmann; 2008Description: xxxvi, 856p. : ill. ; Rs. 6796.00ISBN:

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Holdings
Item type	Home library	Collection	Call number	Status	Barcode
BOOKS	AMRITA SCHOOL OF ENGINEERING	REFERENCE	621.382.77.5 P80 (Browse shelf(Opens below))	Not for loan	69434
BOOKS	AMRITA SCHOOL OF ENGINEERING	REFERENCE	621.382.77.5 P80 (Browse shelf(Opens below))	Not for loan	69435

Includes index

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Central Library - Coimbatore